Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and NanoscratchingApplication to Rough and Natural Surfaces\nAuthor(s): Gerd Kaupp\nFormat: Paperback\nPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany\nImprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K\nISBN-13: 9783642066634, 978-3642066634\nSynopsis\nMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of na.
Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and NanoscratchingApplication to Rough and Natural Surfaces\nAuthor(s): Gerd Kaupp\nFormat: Paperback\nPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany\nImprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K\nISBN-13: 9783642066634, 978-3642066634\nSynopsis\nMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of na.
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